# On Improving Transition Test Set Quality to Detect CMOS Transistor Stuck-Open Faults

> Research article (2015 IEEE 24th Asian Test Symposium (ATS), 2015) · cited 10× · AI/ML

**Wikidata**: [openalex:W2294988400](https://www.wikidata.org/wiki/openalex:W2294988400)  
**Source**: https://4ort.xyz/entity/on-improving-transition-test-set-quality-to-detect-cmos-transistor-stuck-open-faults