# On-chip I–V variability and random telegraph noise characterization in 28 nm CMOS

> Research article (2016 46th European Solid-State Device Research Conference (ESSDERC), 2016) · cited 10× · AI/ML

**Wikidata**: [openalex:W2534445660](https://www.wikidata.org/wiki/openalex:W2534445660)  
**Source**: https://4ort.xyz/entity/on-chip-iv-variability-and-random-telegraph-noise-characterization-in-28-nm-cmos