# Novel method for detection of mixed-type defect patterns in wafer maps based on a single shot detector algorithm

> Research article (Journal of Intelligent Manufacturing, 2021) · cited 34× · AI/ML

**Wikidata**: [openalex:W3139531532](https://www.wikidata.org/wiki/openalex:W3139531532)  
**Source**: https://4ort.xyz/entity/novel-method-for-detection-of-mixed-type-defect-patterns-in-wafer-maps-based-on-a-single-shot-detector-algorithm