# Non-Intrusive Online Distributed Pulse Shrinking-Based Interconnect Testing in 2.5D IC

> Research article (IEEE Transactions on Circuits & Systems II Express Briefs, 2019) · cited 51× · AI/ML

**Wikidata**: [openalex:W2997958323](https://www.wikidata.org/wiki/openalex:W2997958323)  
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