# Noise-Induced Resistance Broadening in Resistive Switching Memory—Part I: Intrinsic Cell Behavior

> Research article (IEEE Transactions on Electron Devices, 2015) · cited 50× · AI/ML

**Wikidata**: [openalex:W1908389539](https://www.wikidata.org/wiki/openalex:W1908389539)  
**Source**: https://4ort.xyz/entity/noise-induced-resistance-broadening-in-resistive-switching-memorypart-i-intrinsic-cell-behavior