# Noise behavior of vertical tunnel FETs under the influence of interface trap states

> Research article (Microelectronics Journal, 2021) · cited 26× · AI/ML

**Wikidata**: [openalex:W3170326719](https://www.wikidata.org/wiki/openalex:W3170326719)  
**Source**: https://4ort.xyz/entity/noise-behavior-of-vertical-tunnel-fets-under-the-influence-of-interface-trap-states