# New Insights into the Amplitude of Random Telegraph Noise in Nanoscale MOS Devices

> Research article (2017 IEEE International Reliability Physics Symposium (IRPS), 2017) · cited 19× · AI/ML

**Wikidata**: [openalex:W2620783965](https://www.wikidata.org/wiki/openalex:W2620783965)  
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