# New high resolution Random Telegraph Noise (RTN) characterization method for resistive RAM

> Research article (Solid-State Electronics, 2015) · cited 16× · AI/ML

**Wikidata**: [openalex:W2051280518](https://www.wikidata.org/wiki/openalex:W2051280518)  
**Source**: https://4ort.xyz/entity/new-high-resolution-random-telegraph-noise-rtn-characterization-method-for-resistive-ram