# Multiple Stuck-at Fault Testability Analysis of ROBDD Based Combinational Circuit Design

> Research article (Journal of Electronic Testing, 2018) · cited 11× · AI/ML

**Wikidata**: [openalex:W2786113719](https://www.wikidata.org/wiki/openalex:W2786113719)  
**Source**: https://4ort.xyz/entity/multiple-stuck-at-fault-testability-analysis-of-robdd-based-combinational-circuit-design