# Multiple Granularities Generative Adversarial Network for Recognition of Wafer Map Defects

> Research article (IEEE Transactions on Industrial Informatics, 2021) · cited 66× · AI/ML

**Wikidata**: [openalex:W3173262613](https://www.wikidata.org/wiki/openalex:W3173262613)  
**Source**: https://4ort.xyz/entity/multiple-granularities-generative-adversarial-network-for-recognition-of-wafer-map-defects