# Multifeature, Sparse-Based Approach for Defects Detection and Classification in Semiconductor Units

> Research article (IEEE Transactions on Automation Science and Engineering, 2016) · cited 52× · AI/ML

**Wikidata**: [openalex:W2509669877](https://www.wikidata.org/wiki/openalex:W2509669877)  
**Source**: https://4ort.xyz/entity/multifeature-sparse-based-approach-for-defects-detection-and-classification-in-semiconductor-units