# Multi-Frequency Test Generation for Incipient Faults in Analog Circuits Based on the Aliasing Measuring Model

> Research article (IEEE Access, 2018) · cited 13× · AI/ML

**Wikidata**: [openalex:W2809231460](https://www.wikidata.org/wiki/openalex:W2809231460)  
**Source**: https://4ort.xyz/entity/multi-frequency-test-generation-for-incipient-faults-in-analog-circuits-based-on-the-aliasing-measuring-model