# Modeling Valance Change Memristor Device: Oxide Thickness, Material Type, and Temperature Effects

> Research article (IEEE Transactions on Circuits and Systems I Regular Papers, 2016) · cited 33× · AI/ML

**Wikidata**: [openalex:W2556305966](https://www.wikidata.org/wiki/openalex:W2556305966)  
**Source**: https://4ort.xyz/entity/modeling-valance-change-memristor-device-oxide-thickness-material-type-and-temperature-effects