# Modeling and Optimization of Bilayered TaO<sub>x</sub>RRAM Based on Defect Evolution and Phase Transition Effects

> Research article (IEEE Transactions on Electron Devices, 2016) · cited 35× · AI/ML

**Wikidata**: [openalex:W2303962859](https://www.wikidata.org/wiki/openalex:W2303962859)  
**Source**: https://4ort.xyz/entity/modeling-and-optimization-of-bilayered-tao-sub-x-sub-rram-based-on-defect-evolution-and-phase-transition-effects