# Model Mis-Specification Analyses of Weibull and Gamma Models Based on One-Shot Device Test Data

> Research article (IEEE Transactions on Reliability, 2017) · cited 30× · AI/ML

**Wikidata**: [openalex:W2617293968](https://www.wikidata.org/wiki/openalex:W2617293968)  
**Source**: https://4ort.xyz/entity/model-mis-specification-analyses-of-weibull-and-gamma-models-based-on-one-shot-device-test-data