# Mixup-based classification of mixed-type defect patterns in wafer bin maps

> Research article (Computers & Industrial Engineering, 2022) · cited 33× · AI/ML

**Wikidata**: [openalex:W4210493968](https://www.wikidata.org/wiki/openalex:W4210493968)  
**Source**: https://4ort.xyz/entity/mixup-based-classification-of-mixed-type-defect-patterns-in-wafer-bin-maps