# Mixed-Type Wafer Defect Pattern Recognition Framework Based on Multifaceted Dynamic Convolution

> Research article (IEEE Transactions on Instrumentation and Measurement, 2022) · cited 20× · AI/ML

**Wikidata**: [openalex:W4285219337](https://www.wikidata.org/wiki/openalex:W4285219337)  
**Source**: https://4ort.xyz/entity/mixed-type-wafer-defect-pattern-recognition-framework-based-on-multifaceted-dynamic-convolution