# Mixed-type wafer defect detection based on multi-branch feature enhanced residual module

> Research article (Expert Systems with Applications, 2023) · cited 24× · AI/ML

**Wikidata**: [openalex:W4389117284](https://www.wikidata.org/wiki/openalex:W4389117284)  
**Source**: https://4ort.xyz/entity/mixed-type-wafer-defect-detection-based-on-multi-branch-feature-enhanced-residual-module