# Manufacturing intelligence for reducing false alarm of defect classification by integrating similarity matching approach in CMOS image sensor manufacturing

> Research article (Computers & Industrial Engineering, 2016) · cited 37× · AI/ML

**Wikidata**: [openalex:W2345620643](https://www.wikidata.org/wiki/openalex:W2345620643)  
**Source**: https://4ort.xyz/entity/manufacturing-intelligence-for-reducing-false-alarm-of-defect-classification-by-integrating-similarity-matching-approach