# Machine learning-based virtual metrology on film thickness in amorphous carbon layer deposition process

> Research article (Measurement Sensors, 2021) · cited 34× · AI/ML

**Wikidata**: [openalex:W3157884173](https://www.wikidata.org/wiki/openalex:W3157884173)  
**Source**: https://4ort.xyz/entity/machine-learning-based-virtual-metrology-on-film-thickness-in-amorphous-carbon-layer-deposition-process
