# Machine Learning-Based Test Pattern Generation for Neuromorphic Chips

> Research article (2021 IEEE/ACM International Conference On Computer Aided Design (ICCAD), 2021) · cited 15× · AI/ML

**Wikidata**: [openalex:W4200200280](https://www.wikidata.org/wiki/openalex:W4200200280)  
**Source**: https://4ort.xyz/entity/machine-learning-based-test-pattern-generation-for-neuromorphic-chips