# Machine learning based test pattern analysis for localizing critical power activity areas

> Research article (2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2017) · cited 10× · AI/ML

**Wikidata**: [openalex:W2782929815](https://www.wikidata.org/wiki/openalex:W2782929815)  
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