# Machine Learning-Based Statistical Approach to Analyze Process Dependencies on Threshold Voltage in Recessed Gate AlGaN/GaN MIS-HEMTs

> Research article (IEEE Transactions on Electron Devices, 2020) · cited 38× · AI/ML

**Wikidata**: [openalex:W3094910443](https://www.wikidata.org/wiki/openalex:W3094910443)  
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