# Machine Learning Assisted Statistical Variation Analysis of Ferroelectric Transistors: From Experimental Metrology to Predictive Modeling

> Research article (2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2022) · cited 17× · AI/ML

**Wikidata**: [openalex:W4286571831](https://www.wikidata.org/wiki/openalex:W4286571831)  
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