# Machine Learning-Assisted Statistical Variation Analysis of Ferroelectric Transistor: From Experimental Metrology to Adaptive Modeling

> Research article (IEEE Transactions on Electron Devices, 2023) · cited 16× · AI/ML

**Wikidata**: [openalex:W4321780157](https://www.wikidata.org/wiki/openalex:W4321780157)  
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