# Machine Learning Assisted Accurate Estimation of Usage Duration and Manufacturer for Recycled and Counterfeit Flash Memory Detection

> Research article (2019 IEEE 28th Asian Test Symposium (ATS), 2019) · cited 11× · AI/ML

**Wikidata**: [openalex:W2999794310](https://www.wikidata.org/wiki/openalex:W2999794310)  
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