# Machine Learning Aided Device Simulation of Work Function Fluctuation for Multichannel Gate-All-Around Silicon Nanosheet MOSFETs

> Research article (IEEE Transactions on Electron Devices, 2021) · cited 46× · AI/ML

**Wikidata**: [openalex:W3170461766](https://www.wikidata.org/wiki/openalex:W3170461766)  
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