# Machine Intelligence for Efficient Test Pattern Generation

> Research article (2020 IEEE International Test Conference (ITC), 2020) · cited 26× · AI/ML

**Wikidata**: [openalex:W3124695806](https://www.wikidata.org/wiki/openalex:W3124695806)  
**Source**: https://4ort.xyz/entity/machine-intelligence-for-efficient-test-pattern-generation