# Low Noise and High Photodetection Probability SPAD in 180 nm Standard CMOS Technology

> Research article (2018 IEEE International Symposium on Circuits and Systems (ISCAS), 2018) · cited 14× · AI/ML

**Wikidata**: [openalex:W2799276469](https://www.wikidata.org/wiki/openalex:W2799276469)  
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