# Low frequency noise variability in ultra scaled FD-SOI n-MOSFETs: Dependence on gate bias, frequency and temperature

> Research article (Solid-State Electronics, 2015) · cited 20× · AI/ML

**Wikidata**: [openalex:W2214274120](https://www.wikidata.org/wiki/openalex:W2214274120)  
**Source**: https://4ort.xyz/entity/low-frequency-noise-variability-in-ultra-scaled-fd-soi-n-mosfets-dependence-on-gate-bias-frequency-and-temperature