# Low-Frequency Noise in Vertical InAs/InGaAs Gate-All-Around MOSFETs at 15 K for Cryogenic Applications

> Research article (IEEE Electron Device Letters, 2022) · cited 13× · AI/ML

**Wikidata**: [openalex:W4310664597](https://www.wikidata.org/wiki/openalex:W4310664597)  
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