# Low-Frequency Noise Characterization of AlGaN/GaN HEMTs and MIS-HEMTs under UV Illumination

> Research article (IEEE Transactions on Nanotechnology, 2020) · cited 15× · AI/ML

**Wikidata**: [openalex:W3024598934](https://www.wikidata.org/wiki/openalex:W3024598934)  
**Source**: https://4ort.xyz/entity/low-frequency-noise-characterization-of-algan-gan-hemts-and-mis-hemts-under-uv-illumination