# Low-Frequency Noise Characterization in GaN HEMTs: Investigation of Deep Levels and Their Physical Properties

> Research article (IEEE Electron Device Letters, 2017) · cited 23× · AI/ML

**Wikidata**: [openalex:W2686568705](https://www.wikidata.org/wiki/openalex:W2686568705)  
**Source**: https://4ort.xyz/entity/low-frequency-noise-characterization-in-gan-hemts-investigation-of-deep-levels-and-their-physical-properties