# Low-Frequency Noise Assessment of Vertically Stacked Si n-Channel Nanosheet FETs With Different Metal Gates

> Research article (IEEE Transactions on Electron Devices, 2020) · cited 22× · AI/ML

**Wikidata**: [openalex:W3087773294](https://www.wikidata.org/wiki/openalex:W3087773294)  
**Source**: https://4ort.xyz/entity/low-frequency-noise-assessment-of-vertically-stacked-si-n-channel-nanosheet-fets-with-different-metal-gates