# Low-Frequency Noise Assessment of the Oxide Trap Density in Thick-Oxide Input-Output Transistors for DRAM Applications

> Research article (ECS Journal of Solid State Science and Technology, 2016) · cited 12× · AI/ML

**Wikidata**: [openalex:W2353451406](https://www.wikidata.org/wiki/openalex:W2353451406)  
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