# Low Frequency Noise and Gate Bias Instability in Normally OFF AlGaN/GaN HEMTs

> Research article (IEEE Transactions on Electron Devices, 2016) · cited 29× · AI/ML

**Wikidata**: [openalex:W2323314521](https://www.wikidata.org/wiki/openalex:W2323314521)  
**Source**: https://4ort.xyz/entity/low-frequency-noise-and-gate-bias-instability-in-normally-off-algan-gan-hemts