# Localized characterization of charge transport and random telegraph noise at the nanoscale in HfO2 films combining scanning tunneling microscopy and multi-scale simulations

> Research article (Journal of Applied Physics, 2017) · cited 11× · AI/ML

**Wikidata**: [openalex:W2734814130](https://www.wikidata.org/wiki/openalex:W2734814130)  
**Source**: https://4ort.xyz/entity/localized-characterization-of-charge-transport-and-random-telegraph-noise-at-the-nanoscale-in-hfo2-films-combining-scann