# Linear regression combined KNN algorithm to identify latent defects for imbalance data of ICs

> Research article (Microelectronics Journal, 2022) · cited 32× · AI/ML

**Wikidata**: [openalex:W4309154741](https://www.wikidata.org/wiki/openalex:W4309154741)  
**Source**: https://4ort.xyz/entity/linear-regression-combined-knn-algorithm-to-identify-latent-defects-for-imbalance-data-of-ics