# Linear Characterization and Modeling of GaN-on-Si HEMT Technologies with 100 nm and 60 nm Gate Lengths

> Research article (Electronics, 2021) · cited 12× · AI/ML

**Wikidata**: [openalex:W3118466283](https://www.wikidata.org/wiki/openalex:W3118466283)  
**Source**: https://4ort.xyz/entity/linear-characterization-and-modeling-of-gan-on-si-hemt-technologies-with-100-nm-and-60-nm-gate-lengths