# Learning Traces by Yourself: Blind Image Forgery Localization via Anomaly Detection With ViT-VAE

> Research article (IEEE Signal Processing Letters, 2023) · cited 30× · AI/ML

**Wikidata**: [openalex:W4321021643](https://www.wikidata.org/wiki/openalex:W4321021643)  
**Source**: https://4ort.xyz/entity/learning-traces-by-yourself-blind-image-forgery-localization-via-anomaly-detection-with-vit-vae