# Learning from single-defect wafer maps to classify mixed-defect wafer maps

> Research article (Expert Systems with Applications, 2023) · cited 27× · AI/ML

**Wikidata**: [openalex:W4383105430](https://www.wikidata.org/wiki/openalex:W4383105430)  
**Source**: https://4ort.xyz/entity/learning-from-single-defect-wafer-maps-to-classify-mixed-defect-wafer-maps
