# LASIC: Layout Analysis for Systematic IC-Defect Identification Using Clustering

> Research article (IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2015) · cited 27× · AI/ML

**Wikidata**: [openalex:W1980810142](https://www.wikidata.org/wiki/openalex:W1980810142)  
**Source**: https://4ort.xyz/entity/lasic-layout-analysis-for-systematic-ic-defect-identification-using-clustering