# Knowledge augmented broad learning system for computer vision based mixed-type defect detection in semiconductor manufacturing

> Research article (Robotics and Computer-Integrated Manufacturing, 2022) · cited 39× · AI/ML

**Wikidata**: [openalex:W4313335956](https://www.wikidata.org/wiki/openalex:W4313335956)  
**Source**: https://4ort.xyz/entity/knowledge-augmented-broad-learning-system-for-computer-vision-based-mixed-type-defect-detection-in-semiconductor-manufac