# K-means clustering with morphological filtering for silicon wafer grain defect detection

> Research article (2020 IEEE 4th Information Technology, Networking, Electronic and Automation Control Conference (ITNEC), 2020) · cited 11× · AI/ML

**Wikidata**: [openalex:W3021430555](https://www.wikidata.org/wiki/openalex:W3021430555)  
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