# Joint Feature and Label Adversarial Network for Wafer Map Defect Recognition

> Research article (IEEE Transactions on Automation Science and Engineering, 2020) · cited 32× · AI/ML

**Wikidata**: [openalex:W3038560814](https://www.wikidata.org/wiki/openalex:W3038560814)  
**Source**: https://4ort.xyz/entity/joint-feature-and-label-adversarial-network-for-wafer-map-defect-recognition