# Ionizing-Radiation Response and Low-Frequency Noise of 28-nm MOSFETs at Ultrahigh Doses

> Research article (IEEE Transactions on Nuclear Science, 2020) · cited 59× · AI/ML

**Wikidata**: [openalex:W3011939993](https://www.wikidata.org/wiki/openalex:W3011939993)  
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