# Ionizing Radiation Effects on the Noise of 65 nm CMOS Transistors for Pixel Sensor Readout at Extreme Total Dose Levels

> Research article (IEEE Transactions on Nuclear Science, 2017) · cited 12× · AI/ML

**Wikidata**: [openalex:W2769296758](https://www.wikidata.org/wiki/openalex:W2769296758)  
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