# Ion Beam-Mediated Defect Engineering in TiO<sub><i>x</i></sub> Thin Films for Controlled Resistive Switching Property and Application

> Research article (ACS Applied Electronic Materials, 2021) · cited 21× · AI/ML

**Wikidata**: [openalex:W3193912555](https://www.wikidata.org/wiki/openalex:W3193912555)  
**Source**: https://4ort.xyz/entity/ion-beam-mediated-defect-engineering-in-tio-sub-i-x-i-sub-thin-films-for-controlled-resistive-switching-property-and-app