# Investigation of trap levels in HgCdTe IR detectors through low frequency noise spectroscopy

> Research article (Semiconductor Science and Technology, 2016) · cited 21× · AI/ML

**Wikidata**: [openalex:W2540583727](https://www.wikidata.org/wiki/openalex:W2540583727)  
**Source**: https://4ort.xyz/entity/investigation-of-trap-levels-in-hgcdte-ir-detectors-through-low-frequency-noise-spectroscopy