# Investigation of resistance fluctuations in ReRAM: physical origin, temporal dependence and impact on memory reliability

> Research article (2023 IEEE International Reliability Physics Symposium (IRPS), 2023) · cited 14× · AI/ML

**Wikidata**: [openalex:W4376606671](https://www.wikidata.org/wiki/openalex:W4376606671)  
**Source**: https://4ort.xyz/entity/investigation-of-resistance-fluctuations-in-reram-physical-origin-temporal-dependence-and-impact-on-memory-reliability